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Creators/Authors contains: "Yu, Yuan"

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  1. ; ; ; ; ; ; ; ; (, physica status solidi (RRL) – Rapid Research Letters)
    null (Ed.)
    Full Text Available 
  2. ; ; ; ; ; (, Advanced Materials Interfaces)
    Abstract Highly resistive grain boundaries significantly reduce the electrical conductivity that compromises the thermoelectric figure‐of‐meritzTin n‐type polycrystalline Mg3Sb2. In this work, discovered is a Mg deficiency near grain boundaries using atom‐probe tomography. Approximately 5 at% of Mg deficiency is observed uniformly in a 10 nm region along the grain boundary without any evidence of a stable secondary or impurity phase. The off‐stoichiometry can prevent n‐type dopants from providing electrons, lowering the local carrier concentration near the grain boundary and thus the local conductivity. This observation explains how nanometer scale compositional variations can dramatically determine thermoelectriczT, and provides concrete strategies to reduce grain‐boundary resistance and increasezTin Mg3Sb2‐based materials. 
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